Characterisation of the phosgene response of a membrane inlet ⁶³Ni ion mobility spectrometerBOCOS-BINTINTAN, Victor; BRITTAIN, Alan; THOMAS, C. L et al.Analyst (London. 1877. Print). 2002, Vol 127, Num 9, pp 1211-1217, issn 0003-2654Article

Determining the angular admittance of a cylindrical mirror analyserWATTS, B; THOMSEN, L; DASTOOR, P. C et al.Surface and interface analysis. 2002, Vol 34, Num 1, pp 782-785, issn 0142-2421Conference Paper

Summary of ISO/TC 201 Standard : VII ISO 15472 : 2001-surface chemical analysis-x-ray photoelectron spectrometers-calibration of energy scalesSEAH, M. P.Surface and interface analysis. 2001, Vol 31, Num 8, pp 721-723, issn 0142-2421Article

Quantum-well states as Fabry-Pérot modes in a thin-film electron interferometerPAGGEL, J. J; MILLER, T; CHIANG, T.-C et al.Science (Washington, D.C.). 1999, Vol 283, Num 5408, pp 1709-1711, issn 0036-8075Article

Field ionization of O₂ on oxygen-covered Pt(111) and W(111) as studied using field ion appearance energy spectroscopySUCHORSKI, Yu.Ultramicroscopy. 1998, Vol 73, Num 1-4, pp 139-145, issn 0304-3991Conference Paper

Application of the Pontriaguin method to a simple model for electron probe microanalysisVILLAFUERTE, M; HELUANI, S; BRIZUELA, H et al.X-ray spectrometry. 1997, Vol 26, Num 1, pp 3-5, issn 0049-8246Article

Two-dimensional hydrogen analysis by time-of-flight-type electron-stimulated desorption spectroscopyUEDA, K; ISHIKAWA, K; YOSHIMURA, M et al.Japanese journal of applied physics. 1997, Vol 36, Num 9AB, pp L1254-L1256, issn 0021-4922, 2Article

Continuous fluorescence correction in electron probe microanalysis applying an electron scattering modelPFEIFFER, A; SCHIEBL, C; WERNISCH, J et al.X-ray spectrometry. 1996, Vol 25, Num 3, pp 131-137, issn 0049-8246Article

Generalization of the Tougaard method for inelastic-background estimation in electron spectroscopy: incorporation of a depth-dependent inelastic mean free pathGRAAT, P. C. J; SOMERS, M. A. J; BÖTTGER, A et al.Surface and interface analysis. 1995, Vol 23, Num 1, pp 44-49, issn 0142-2421Article

Multiple least-squares fitting for quantitative electron energy-loss spectroscopy: an experimental investigation using standard specimensDOOR, R; GÄNGLER, D.Ultramicroscopy. 1995, Vol 58, Num 2, pp 197-210, issn 0304-3991Article

Low-energy Ar neutral beam etching method for X-ray photoelectron spectroscopyIIJIMA, Y; YAMADA, T; MATSUMOTO, S et al.Surface and interface analysis. 1994, Vol 21, Num 11, pp 778-784, issn 0142-2421Article

Electron spectrometers for inelastic scattering from magnetic surface excitationsIBACH, Harald; ETZKORN, Markus; KIRSCHNER, Jürgen et al.Surface and interface analysis. 2006, Vol 38, Num 12-13, pp 1615-1617, issn 0142-2421, 3 p.Conference Paper

Development and evaluation of a nano-electrospray ionisation source for atmospheric pressure ion mobility spectrometryBRAMWELL, Claire J; COLGRAVE, Michelle L; CREASER, Colin S et al.Analyst (London. 1877. Print). 2002, Vol 127, Num 11, pp 1467-1470, issn 0003-2654, 4 p.Article

Construction and characterization of a diode laser system for atomic spectrometric experimentsGALBACS, Gabor; GALBACS, Zoltan; GERETOVSZKY, Zsolt et al.Microchemical journal. 2002, Vol 73, Num 1-2, pp 27-38, issn 0026-265X, 12 p.Conference Paper

Concentration limits for the measurement of boron by electron energy-loss spectroscopy and electron-spectroscopic imagingZHU, Y; EGERTON, R. F; MALAC, M et al.Ultramicroscopy. 2001, Vol 87, Num 3, pp 135-145, issn 0304-3991Article

IMS: Ultratrace organic screening in secondsDEBONO, Reno.American laboratory (Fairfield). 2001, Vol 33, Num 25, pp 26-27, issn 0044-7749Article

A new analyzer for spin resolved electron spectroscopiesBERTACCO, R; DUO, L; ISELLA, G et al.Journal of magnetism and magnetic materials. 2001, Vol 226-30, pp 2076-2077, issn 0304-8853, 2Conference Paper

The archetypal atom-probePANITZ, J. A.Materials characterization. 2000, Vol 44, Num 1-2, pp 3-10, issn 1044-5803Article

The development of atom probe field-ion microscopyMILLER, M. K.Materials characterization. 2000, Vol 44, Num 1-2, pp 11-27, issn 1044-5803Article

Construction of an ELS-LEED : an electron energy-loss spectrometer with electrostatic two-dimensional angular scanningNAGAO, Tadaaki; HASEGAWA, Shuji.Surface and interface analysis. 2000, Vol 30, Num 1, pp 488-492, issn 0142-2421Conference Paper

On efficiency of secondary-electron detectorsVASICHEV, B. N; MELNIKOV, A. A; POTAPKIN, O. D et al.SPIE proceedings series. 2000, pp 28-33, isbn 0-8194-3850-2Conference Paper

Hairpin-filament electron guns for low-energy useBOESTEN, L; OKADA, K.Measurement science & technology (Print). 2000, Vol 11, Num 5, pp 576-583, issn 0957-0233Article

Special issue: Materials applications of electron holography and related techniquesCARIM, Altaf H; ONO, Yoshimasa; ALLARD, Lawrence F et al.Materials characterization. 1999, Vol 42, Num 4-5, issn 1044-5803, 155 p.Conference Proceedings

Two-wavelength contouring with a pulsed ruby laser by employing TV-holographyZOU, Y.-L; PEDRINI, G; TIZIANI, H et al.Journal of modern optics (Print). 1996, Vol 43, Num 3, pp 639-646, issn 0950-0340Article

An approach to quantitative high-resolution transmission electron microscopy of crystalline materialsKISIELOWSKI, C; SCHWANDER, P; BAUMANN, F. H et al.Ultramicroscopy. 1995, Vol 58, Num 2, pp 131-155, issn 0304-3991Article